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Rohde & Schwarz and NXP Introduce First Reference Design for 28nm Short Range Automotive Radar

Update time : 2024-01-11 09:16:03

Rohde & Schwarz, a supplier of test and measurement equipment, announced its Radar Target Simulator to validate the performance of NXP® Semiconductors' next-generation proximity radar sensor reference design. Automotive radar is a critical technology for enabling advanced driver assistance systems (ADAS) and autonomous driving capabilities, and the collaboration between the two companies will enable the automotive industry to take a new leap forward in the development of automotive radar.

Engineers at Rohde & Schwarz and NXP conducted a comprehensive series of tests to validate a new sensor reference design based on NXP's 28nm RFCMOS radar single-chip SoC (SAF85xx). Rohde & Schwarz's RTS radar test system combines the AREG800 automotive radar echo generator and the QAT100 antenna millimeter-wave front-end to provide unique short-range target emulation capabilities and superior RF performance, as well as advanced signal processing with a number of advanced features. These technologies enable realistic testing of next-generation automotive radar applications and bring the automotive industry's vision of fully autonomous driving one step closer.
NXP's next-generation automotive radar sensor reference design is based on the industry's first 28nm RFCMOS radar single-chip SoC family and utilizes the Rohde & Schwarz RTS radar test system. The radar sensor reference design can be used in short-, medium- and long-range radar applications to meet the safety requirements of the challenging New Car Assessment Program (NCAP), while also addressing the need for driver comfort features, such as highway driving or city navigation functions for the fast-growing L2+ and L3 vehicle segments.
The RTS from Rohde & Schwarz is the only test system suitable for the complete characterization of radar sensors and radar echo generation at object distances down to the airgap value of the radar under test. The system integrates the AREG800A automotive radar echo generator as the digital back-end and the QAT100 Advanced Antenna Array or AREG8-81S as the front-end. This technically superior test solution is suited for the full automotive radar lifecycle, including development labs, Hardware-in-the-Loop (HIL), Vehicle-in-the-Loop (VIL), validation, and production application requirements. The solution also enables scale-up as well as simulation of the most complex traffic scenarios for advanced driver assistance systems.
We are grateful to be working with NXP Semiconductors to accelerate the deployment of advanced automotive radar sensors based on 28nm automotive radar chips," said Gerald Tietscher, vice president of Signal Generators, Power and Instrumentation at Rohde & Schwarz. These sensors meet the increasingly stringent NCAP safety requirements and will help develop new safety applications. With our extensive experience in automotive radar testing, we are able to provide a best-in-class test solution for this radar sensor design based on the industry's first 28nm RFCMOS single-chip radar SoC."

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